Amplitude Detection and Correction in the Field of View of an Optical Microscopy
Aberration measurement and correction on a large field of view in fluorescence microscopy
We present a plug and play module for aberration measurement and correction in fluorescence microscopy.The wavefront correction is performed through direct wavefront reconstruction using the spinning-pupil aberration measurement and controlling a deformable lens in closed loop.The lens corrects the aberrations in the center of the field of view, leaving residual aberrations at the margins, that are removed by anisoplanatic deconvolution.We present experimental results obtained in fluorescence microscopy, with a wide field and a light sheet fluorescence microscope.These results indicate that detection and correction over the full field of view can be achieved with a compact transmissive module placed in the detection path of the fluorescence microscope.
