Muon-Induced X-ray Emission for Material characterization

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Applied Physics

Muon-Induced X-ray Emission for Material characterization

Characterization of a continuous muon source for the Muon-Induced X-ray Emission (MIXE) Technique

We report on a study conducted at the paul scherrer institute (psi) to characterize the capabilities of the muon-induced x-ray emission (mixe) technique at high rates.

Using a hetero-structured sample of known elements and thicknesses , we successfully detected the characteristic muonic x-rays, emitted during the capture of a negative muon by an atom, and the gamma-rays resulting from the nuclear capture of the muon, characterizing the capabilities of this technique.

This sample emphasizes the quality of a continuous beam, and the exceptional signal-to-noise ratio at high rates.

Authors

Sayani Biswas, Lars Gerchow, Hubertus Luetkens, Thomas Prokscha, Aldo Antognini, Niklaus Berger, Thomas Elias Cocolios, Rugard Dressler, Paul Indelicato, Klaus Jungmann, Klaus Kirch, Andreas Knecht, Angela Papa, Randolf Pohl, Maxim Pospelov, Elisa Rapisarda, Peter Reiter, Narongrit Ritjoho, Stephanie Roccia, Nathal Severijns

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